A paper by recently-graduated C&CB graduate student Michael Jaquith and Asssociate Professor John Marohn is featured on the front cover of the 14 September 2009 edition of the Journal of Materials Chemistry.
In this paper, Jaquith et al. report the first-ever microscopic study of charge trapping in a recently-developed class of organic semiconductors based on functionalized pentacene and anthradithiophene. The journal cover shows images of sample topography, over a 7 micron by 7 micron area, overlayed with a colorized map of the trapped charge density. The two right-most samples in the cover image show evidence of grain-boundary trapping.
The study harnessed Cornell's nanofabrication, nanocharacterization, and materials facilities, in concert with a highly sensitive electric force microscope developed by Marohn's research team. The work was funded by the U.S. National Science Foundation and was done in collaboration with Professor John Anthony of the University of Kentucky.
